3.0

credits

Average Course Rating

An undergraduate level introduction to experimental techniques and data analysis for characterizing the microstructure of materials in three dimensions.Topics to be covered include serial sectioning, principles of optical and scanning-electron microscopy and electron back-scatter diffraction (EBSD), high-energy x-ray diffraction microscopy, and techniques for 3D data reduction, representation, and analysis. Pre-Requisites: 510.311 & 510.313. Also listed as EN.510.701.