3.0

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An introduction to the uses of x-rays for structural characterization of materials, including (i) kinematic theory of x-ray scattering and diffraction by single crystals, polycrystals, liquids, and amorphous solids; (ii) principles of Fourier optics with applications to x-ray radiography and phase-contrast x-ray imaging; and (iii) x-ray computed tomography (CT). Prerequisite: 510.601 or equivalent.