3.0

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This course will describe a variety of techniques used to characterize the structure and composition of engineering materials, including metals, ceramics, polymers, composites and semiconductors. The emphasis will be on microstructural characterization techniques, including optical and electron microscopy, X-ray diffraction, and thermal analysis and surface analytical techniques, including Auger electron spectroscopy, secondary ion mass spectroscopy, X-ray photoelectron spectroscopy, and atomic force microscopy. Working with the JHU museums, we will use the techniques learned in class to characterize historic artifacts.