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Johns Hopkins University | EN.530.667

Transmission Electron Microscopy: Basic Theories

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Transmission Electron Microscopy (TEM) is nowadays one of the most comprehensive and powerful techniques for materials characterization. Penetration of high-energy electrons through a thin-foil specimen generates rich information of its microstructure, crystallography, composition, and so forth, all of which can be imaged with nanometer to sub-atomic resolution. This course is going to establish the fundamental principles and practical methods of electron diffraction, imaging, and spectroscopy for students in all fields who have recently become or will soon become a TEM user. This course may be (not required) taken in combination with EN.510.662 (Transmission Electron Microscopy: Methods) in spring semesters, which focuses on experimental knowledge and hands-on operation in lab.

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